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Turkish Journal of Physics

Abstract

Using cathodoluminescence spectroscopy directly performed in a scanning transmission electron microscope at liquid helium temperature, the structural and optical properties of GaN nanocolumns, in particular extended defects like stacking faults and dislocations, have been characterized. The influence of the crystalline real structure on the emission properties using the capability of addressing individual stacking faults is comprehensively examined.

DOI

10.3906/fiz-1405-5

Keywords

Scanning transmission electron microscope, cathodoluminescence, extended defects, basal plane stacking fault, GaN nanocolumns

First Page

323

Last Page

327

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