Turkish Journal of Physics
DOI
10.3906/fiz-1306-9
Abstract
Pb_xIn_{25-x}Se_{75} thin films with 2 compositions were prepared by thermal evaporation. The surface topography of these films was studied by transmission electron microscope. The optical reflectance and transmittance were studied in order to determine the optical parameters such as optical energy gap, refractive index, extinction coefficient, dielectric loss, and dielectric tangent loss for these films. A single oscillator theory equation was applied for these films in order to determine both dispersion energy and oscillating energy, and the ratio of free carrier concentration/effective mass (N/m*) was determined optically. It was found that change in the composition of these films affects strongly all their optical and dielectric results.
Keywords
Thin films, structure, optical properties, dielectric loss, optical conductivity, optical switching
First Page
145
Last Page
154
Recommended Citation
ELMELEEGI, HESHAM AZMI; MANDOUH, ZEINAB EL SAYED EL; and MOEZ, AHMED ABDEL
(2014)
"Influence of composition on the structure and optoelectronic properties of Pb_xIn_{25-x}Se_{75} thin films,"
Turkish Journal of Physics: Vol. 38:
No.
1, Article 18.
https://doi.org/10.3906/fiz-1306-9
Available at:
https://journals.tubitak.gov.tr/physics/vol38/iss1/18