Turkish Journal of Physics
Abstract
K-shell fluorescence yields \omega_K were measured for the elements Ti, V, Cr, Fe, Co, Ni, Cu and F and Cl compounds of these elements. Measurements were carried out at 10 keV excitation energy using secondary excitation method. K x-rays emitted by samples were counted by a Si(Li) detector with 160 eV resolution at 5.9 keV. Measurement of K-shell fluorescence yields \omega_K for these elements are compared with earlier experimental results obtained by other methods.
DOI
10.3906/fiz-0905-5
Keywords
X-ray, Fluorescence yield, Halogen compounds.
First Page
311
Last Page
316
Recommended Citation
BAYDAŞ, E, ÖZ, E. O, & BÜYÜKYILDIZ, M (2009). Measurements of K-shell fluorescence yields for Ti, V, Cr, Fe, Co, Ni and Cu elements and their halogen compounds. Turkish Journal of Physics 33 (6): 311-316. https://doi.org/10.3906/fiz-0905-5
