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Turkish Journal of Physics

Abstract

K-shell fluorescence yields \omega_K were measured for the elements Ti, V, Cr, Fe, Co, Ni, Cu and F and Cl compounds of these elements. Measurements were carried out at 10 keV excitation energy using secondary excitation method. K x-rays emitted by samples were counted by a Si(Li) detector with 160 eV resolution at 5.9 keV. Measurement of K-shell fluorescence yields \omega_K for these elements are compared with earlier experimental results obtained by other methods.

DOI

10.3906/fiz-0905-5

Keywords

X-ray, Fluorescence yield, Halogen compounds.

First Page

311

Last Page

316

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