Electrical Characterization of GaTe and GaTe:Cu Semiconductor Compounds

Authors

HÜSNÜ SALİH GÜDER
BAHATTİN ABAY
HASAN EFEOĞLU
CEVDET COŞKUN
ŞAKİR AYDOĞAN
YAHYA KEMAL YOĞURTÇU

DOI

-

Abstract

Electrical properties of GaTe and GaTe:Cu binary compound semiconductors were investigated by Hall effect and resistivity measurements in the 77-320 K temperature range. Donor and acceptor densities, compensation ratios, acceptor ionization energies, valence band effective mass of holes and effective density of states in valence band were determined for the undoped and Cu doped samples using the single donor-single acceptor analysis of the hole concentration. Temperature coefficient of the hole mobility was determined and compared with related theories.

Keywords

Electrical characterization; layered semiconductors; GaTe.

First Page

523

Last Page

528

Recommended Citation

GÜDER, HÜSNÜ SALİH; ABAY, BAHATTİN; EFEOĞLU, HASAN; COŞKUN, CEVDET; AYDOĞAN, ŞAKİR; and YOĞURTÇU, YAHYA KEMAL (2001) "Electrical Characterization of GaTe and GaTe:Cu Semiconductor Compounds," Turkish Journal of Physics: Vol. 25: No. 6, Article 5. Available at: https://journals.tubitak.gov.tr/physics/vol25/iss6/5