Turkish Journal of Physics
DOI
-
Abstract
Polycrystalline thin film of the graded system CdTe_{1-x}S_{x} for x=0,0.1,\ldots,1 are prepared by using thermal evaporation technique deposited on the glass substrate with an average thickness 3000 Å for each individual value of x . XRD technique is used with the aid of a computational program to study the phase change from cubic zinc blend structure to hexagonal wurtzite with an inversion point related to the x-value. It is found that x=0.1 gives us an inversion point in the structural change from cubic to hexagonal phase.
Keywords
Thin films, ternary compound, structural behaviour and miller indices
First Page
355
Last Page
362
Recommended Citation
AL-SHAKARCHI, EMAD KHDAYER (2001) "Computational Study for the Structural Change of the System CdTe_{1-x} S_x Thin Film," Turkish Journal of Physics: Vol. 25: No. 4, Article 8. Available at: https://journals.tubitak.gov.tr/physics/vol25/iss4/8
