Turkish Journal of Physics
Abstract
Polycrystalline thin film of the graded system CdTe_{1-x}S_{x} for x=0,0.1,\ldots,1 are prepared by using thermal evaporation technique deposited on the glass substrate with an average thickness 3000 Å for each individual value of x . XRD technique is used with the aid of a computational program to study the phase change from cubic zinc blend structure to hexagonal wurtzite with an inversion point related to the x-value. It is found that x=0.1 gives us an inversion point in the structural change from cubic to hexagonal phase.
DOI
-
Keywords
Thin films, ternary compound, structural behaviour and miller indices
First Page
355
Last Page
362
Recommended Citation
AL-SHAKARCHI, EMAD KHDAYER (2001) "Computational Study for the Structural Change of the System CdTe_{1-x} S_x Thin Film," Turkish Journal of Physics: Vol. 25: No. 4, Article 8. Available at: https://journals.tubitak.gov.tr/physics/vol25/iss4/8
