Turkish Journal of Physics
DOI
-
Abstract
The normal reflectance of single crystal Si was measured at 0.5 5.6 eV range by unpolarized light. Optical parameters of Si were determined from this reflectance data by using two different methods: oscillator fit procedure and Kramers-Kronig analysis. The refractive index, extinction coefficient and the real and imaginary parts of complex dielectric constant obtained by these two methods were compared. A good agreement was found between two methods. Furthermore, the optical parameters so obtained seem to be in a satisfactory agreement with the literature.
Keywords
Optical Constant, Si Single Crystals, Oscillator Fit Procedure, Kramers-Kronig Analysis.
First Page
725
Last Page
735
Recommended Citation
DURMUŞ, HAZİRET; ŞAFAK, HALUK; and KARABIYIK, HALDUN (2000) "Determination of Optical Constant of Materials by two Different Methods: An Application to Single Crystals Si," Turkish Journal of Physics: Vol. 24: No. 6, Article 6. Available at: https://journals.tubitak.gov.tr/physics/vol24/iss6/6
