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Turkish Journal of Physics

Abstract

A glancing incidence EXAFS experiment has been carried out with evaporated silver films on glass substrates. Prior to EXAFS data collection, a reflectivity curve was performed from which the critical angle for total external reflection of x-rays from surface were determined. The analysed EXAFS data revealed that there is a reduction in the coordination number and an increase in Debye-Waller factor compared to bulk values. These changes were explained in terms of grain size effect and the surface effects of the silver film.

DOI

-

First Page

551

Last Page

556

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