Turkish Journal of Physics
Abstract
Thin films (35 \AA) of $Al_2O_3$ on glass slides have been used for the fabrication of $Al/Al_2O_3/Al, Ag/Al_2O_3/Al$ and $Cu/Al_2O_3/Al$ devices. The room temperature current-voltage characteristics and the dependence of current densities of these devices at various wavelength $(\lambda)$ of light were measured. The results obtained on current density and photocurrent show that $Al_2O_3$ films have the potential for wider applications like antireflective coatings or treatments in photovoltaic devices, transparent insulation materials, and optical trapping surfaces in many electronic devices.
DOI
-
First Page
315
Last Page
324
Recommended Citation
SINGH, K. and HAMMOND, S.N.A. (1998) "Current-Voltage Characteristics and Photoresponse of Metal Metal Devices," Turkish Journal of Physics: Vol. 22: No. 4, Article 6. Available at: https://journals.tubitak.gov.tr/physics/vol22/iss4/6
