Abstract

Thin films (35 \AA) of $Al_2O_3$ on glass slides have been used for the fabrication of $Al/Al_2O_3/Al, Ag/Al_2O_3/Al$ and $Cu/Al_2O_3/Al$ devices. The room temperature current-voltage characteristics and the dependence of current densities of these devices at various wavelength $(\lambda)$ of light were measured. The results obtained on current density and photocurrent show that $Al_2O_3$ films have the potential for wider applications like antireflective coatings or treatments in photovoltaic devices, transparent insulation materials, and optical trapping surfaces in many electronic devices.

DOI

First Page

315

Last Page

324

Recommended Citation

SINGH, K, & HAMMOND, S (1998). Current-Voltage Characteristics and Photoresponse of Metal Metal Devices. Turkish Journal of Physics 22 (4): 315-324. https://doi.org/-

Download