Turkish Journal of Physics
DOI
-
Abstract
Thin films (35 \AA) of $Al_2O_3$ on glass slides have been used for the fabrication of $Al/Al_2O_3/Al, Ag/Al_2O_3/Al$ and $Cu/Al_2O_3/Al$ devices. The room temperature current-voltage characteristics and the dependence of current densities of these devices at various wavelength $(\lambda)$ of light were measured. The results obtained on current density and photocurrent show that $Al_2O_3$ films have the potential for wider applications like antireflective coatings or treatments in photovoltaic devices, transparent insulation materials, and optical trapping surfaces in many electronic devices.
First Page
315
Last Page
324
Recommended Citation
SINGH, K. and HAMMOND, S.N.A. (1998) "Current-Voltage Characteristics and Photoresponse of Metal Metal Devices," Turkish Journal of Physics: Vol. 22: No. 4, Article 6. Available at: https://journals.tubitak.gov.tr/physics/vol22/iss4/6
