Survey of Structural Evolution in Carbonic Materials By First Order Raman Spectrum; Comparison to X-Ray Diffractometry Data

Authors

Reshnik ANGONI
Ilia PRIFTI
Jani DODE

Abstract

Relative heights of "defective" bands in the Raman spectrum of carbonic materials are sensitive parameters towards structural transformations happening in the sample. Raman microspectrometry and X-ray diffractometry information are used to study the correlation between structural evolution and the reduction of defects.

DOI

-

First Page

559

Last Page

566

Recommended Citation

ANGONI, R, PRIFTI, I, & DODE, J (1997). Survey of Structural Evolution in Carbonic Materials By First Order Raman Spectrum; Comparison to X-Ray Diffractometry Data. Turkish Journal of Physics 21 (4): 559-566. https://doi.org/-