Turkish Journal of Physics
Preparation of Thin Bi_{2}Sr_{2}CaCu_{2}O_{x} (2212) Film and Electrical Measurements
DOI
-
Abstract
A thin film with the nominal composition of Bi_{2}Sr_{2}CaCu_{2}O_{x}(2212) was prepared on a MgO single crystal substrate by electron beam evaporation technique. The film, analyzed by x-ray diffraction, showed a preferential orientation with the c-axis prependicular to the substrate. The existence of at least two phases was seen from x-ray analysis. Electrical measurement was performed on the thin film of 2212 composition. The resistivity was confirmed to be smaller then 0.20x10^{-4} \Omega.cm by using the van der Pauw method at 300K and critical current density was in excess of 1.2x10^{4} A/cm^{2} at 38K in zero field.
First Page
1012
Last Page
1016
Recommended Citation
VARILCI, A.; YANMAZ, E.; and MUTLU, I. H. (1996) "Preparation of Thin Bi_{2}Sr_{2}CaCu_{2}O_{x} (2212) Film and Electrical Measurements," Turkish Journal of Physics: Vol. 20: No. 9, Article 2. Available at: https://journals.tubitak.gov.tr/physics/vol20/iss9/2
