Turkish Journal of Physics

Preparation of Thin Bi_{2}Sr_{2}CaCu_{2}O_{x} (2212) Film and Electrical Measurements




A thin film with the nominal composition of Bi_{2}Sr_{2}CaCu_{2}O_{x}(2212) was prepared on a MgO single crystal substrate by electron beam evaporation technique. The film, analyzed by x-ray diffraction, showed a preferential orientation with the c-axis prependicular to the substrate. The existence of at least two phases was seen from x-ray analysis. Electrical measurement was performed on the thin film of 2212 composition. The resistivity was confirmed to be smaller then 0.20x10^{-4} \Omega.cm by using the van der Pauw method at 300K and critical current density was in excess of 1.2x10^{4} A/cm^{2} at 38K in zero field.

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