Turkish Journal of Physics
Acceptor Levels of Substitutional Zn, Cd and Hg Impurity Atoms in Ge_{1-x}Si_x Crystals
DOI
-
Abstract
Hall measurement has been carried out for a set of Zn, Cd and Hg-doped Ge_{1-x}Si_x crystals (0 \leq X \leq 0,3). It is shown that the substitutional Zn_s and Cd_s atoms in Ge_{1-x}Si_x and Si behave as double acceptor as in Ge. In silicon the Hg_s atoms give rise to one deep acceptor center. The binding energies of the Zn_s, Cd_s and Hg_s acceptor states in Ge_{1-x}Si_x increase linearly with the silicon content. This result agrees qualitatively with the concept of a virtual crystal model. Random-alloy splitting of the Zn_s, Cd_s and Hg_s impurity levels in the crystals is iscussed.
First Page
269
Last Page
274
Recommended Citation
AZHDAROV, G. Kh. and KYAZIMZADE, R.Z. (1996) "Acceptor Levels of Substitutional Zn, Cd and Hg Impurity Atoms in Ge_{1-x}Si_x Crystals," Turkish Journal of Physics: Vol. 20: No. 3, Article 10. Available at: https://journals.tubitak.gov.tr/physics/vol20/iss3/10