Structural Studies of Laser Induced Doped Germanium Using X-ray Diffraction

Authors

A. MOUSA
R.A. SMAIL

Abstract

Aspects of the structure of Ge dipped into various dopant solutions are elucidated by x-ray diffraction into three distinct groups, at low energy density.

DOI

-

First Page

1130

Last Page

1135

Recommended Citation

MOUSA, A. and SMAIL, R.A. (1996) "Structural Studies of Laser Induced Doped Germanium Using X-ray Diffraction," Turkish Journal of Physics: Vol. 20: No. 10, Article 6. Available at: https://journals.tubitak.gov.tr/physics/vol20/iss10/6