Structural Studies of Laser Induced Doped Germanium Using X-ray Diffraction

Authors

A. MOUSA
R.A. SMAIL

Abstract

Aspects of the structure of Ge dipped into various dopant solutions are elucidated by x-ray diffraction into three distinct groups, at low energy density.

DOI

-

First Page

1130

Last Page

1135

Recommended Citation

MOUSA, A, & SMAIL, R (1996). Structural Studies of Laser Induced Doped Germanium Using X-ray Diffraction. Turkish Journal of Physics 20 (10): 1130-1135. https://doi.org/-