Electron Spectroscopy for Material Characterization

Authors

Ş. SÜZER

DOI

-

Abstract

Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced through examples with application of these techniques to various surface related problems.

First Page

309

Last Page

320

Recommended Citation

SÜZER, Ş. (1998) "Electron Spectroscopy for Material Characterization," Turkish Journal of Chemistry: Vol. 22: No. 4, Article 1. Available at: https://journals.tubitak.gov.tr/chem/vol22/iss4/1