PIXE, Particel Induced X-Ray Emission A Concise Review

Authors

A. İnhan GARİP

DOI

-

Abstract

PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-estructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.

Keywords

particle induced X-ray emission, elemental analysis, trace element, ion induced X-ray.

First Page

183

Last Page

200

Recommended Citation

GARİP, A. İnhan (1998) "PIXE, Particel Induced X-Ray Emission A Concise Review," Turkish Journal of Chemistry: Vol. 22: No. 3, Article 1. Available at: https://journals.tubitak.gov.tr/chem/vol22/iss3/1