•  
  •  
 

Turkish Journal of Electrical Engineering and Computer Sciences

VAHID JAMSHIDI

DOI

10.3906/elk-1812-179

Abstract

Complementary metal oxide semiconductor (CMOS) downscaling leads to various challenges, such as high leakage current and increase in radiation sensitivity. To solve such challenges, hybrid MTJ/CMOS technology-based design has been considered as a very promising approach thanks to the high speed, low power, good scalability, and full compatibility of magnetic tunnel junction (MTJ) devices with CMOS technology. One important application of MTJs is the efficient utilization in building nonvolatile look-up tables (NV-LUTs) used in reconfigurable logic. However, NV-LUTs face severe reliability issues in nanotechnology due to the increasing process variations, reduced supply voltage, and high energetic particle strike at sensitive nodes of CMOS circuits. This paper proposes a nonvolatile radiation-hardened look-up table (NVRH-LUT) for advanced reconfigurable logic. Compared with previous works, the proposed NVRH-LUT is fully robust against single-event upsets and also single-event double-node upsets that are among the main reliability-challenging issues for NV-LUTs. Results have shown that NVRH-LUT not only provides increasing reliability and reduced bit error rate but also offers low delay and low energy consumption.

Keywords

Magnetic tunnel junction, nonvolatility, hybrid MTJ/CMOS logic circuits, radiation immunity, soft error, single-event upset, single-event double-node upset

First Page

4486

Last Page

4501

Download

Share

COinS