Authors: HAZİRET DURMUŞ, HALUK ŞAFAK, HALDUN KARABIYIK
Abstract: The normal reflectance of single crystal Si was measured at 0.5 5.6 eV range by unpolarized light. Optical parameters of Si were determined from this reflectance data by using two different methods: oscillator fit procedure and Kramers-Kronig analysis. The refractive index, extinction coefficient and the real and imaginary parts of complex dielectric constant obtained by these two methods were compared. A good agreement was found between two methods. Furthermore, the optical parameters so obtained seem to be in a satisfactory agreement with the literature.
Keywords: Optical Constant, Si Single Crystals, Oscillator Fit Procedure, Kramers-Kronig Analysis.
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