Authors: A. ASHOUR
Abstract: Cadmium sulphide (CdS) thin films were prepared by chemical spray-pyrolysis technique. Cleaned glass substrates were used. The substrate temperature was varied in the range 200 -- 400 °C and seems to be one of the more important parameters affecting the physical properties of the semiconductor. The films were characterized by X-ray diffraction (XRD). XRD patterns indicated the presence of single-phase hexagonal CdS. The resistivity of the as-deposited films was found to vary in the range 10^3 - 10^5 \Omega. Cm, depending on the substrate temperature. Direct band gap values of 2.39--2.42 eV were obtained from optical absorption measurements.
Keywords: CdS thin films; Spray pyrolysis; Structural characteristics; Electrical and optical properties.
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