Survey of Structural Evolution in Carbonic Materials By First Order Raman Spectrum; Comparison to X-Ray Diffractometry Data

Authors: Reshnik ANGONI, Ilia PRIFTI, Jani DODE

Abstract: Relative heights of "defective" bands in the Raman spectrum of carbonic materials are sensitive parameters towards structural transformations happening in the sample. Raman microspectrometry and X-ray diffractometry information are used to study the correlation between structural evolution and the reduction of defects.