Effect of Carrier Concentration Dependant Mobility on the Performance of High Electron Mobility Transistors


Abstract: The influence of the sheet carrier concentration dependence on mobility on the performance of High Electron Mobility Transistor (HEMT) structures is theoretically modeled. The model basically takes into account both the drift and diffusion part of the overall drain current. The normalised drain current and normalised transconductance are found to be greatly affected by the carrier concentration dependant mobility.


Full Text: PDF