Authors: MURAT DURAK, FARHAD SAMADOV, A. KAMURAN TÜRKOĞLU
Abstract: Accurate determination of the responsivity of silicon photodiodes are highly desired in photometry. The change of responsivity over the surface, the so-called spatial non-uniformity, effects power measurements especially in photodiodes with large active areas. To study this effect, first an intensity-stabilized laser source-optics has been established. A purpose-built step-motor controlled two axis micro mechanical stage has been designed to scan the photodiode surface. In this study, the technique and the results of the uniformity mapping of large area research-grade silicon photodiodes which were measured on the purpose-built set-up are presented.
Keywords: Photometry, Silicon Photodiode, Spatial Uniformity
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