Authors: HÜSNÜ SALİH GÜDER, BAHATTİN ABAY, HASAN EFEOĞLU, CEVDET COŞKUN, ŞAKİR AYDOĞAN, YAHYA KEMAL YOĞURTÇU
Abstract: Electrical properties of GaTe and GaTe:Cu binary compound semiconductors were investigated by Hall effect and resistivity measurements in the 77-320 K temperature range. Donor and acceptor densities, compensation ratios, acceptor ionization energies, valence band effective mass of holes and effective density of states in valence band were determined for the undoped and Cu doped samples using the single donor-single acceptor analysis of the hole concentration. Temperature coefficient of the hole mobility was determined and compared with related theories.
Keywords: Electrical characterization; layered semiconductors; GaTe.
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